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Scanning Electron Microscopy and X-Ray Microanalysis
Download PDF Scanning Electron Microscopy and X-Ray Microanalysis
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Review
Form the reviews of the third edition:“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition does. It is clearly written ... well organized. ... This is a reference text that no SEM or EPMA laboratory should be without.†(Thomas J. Wilson, Scanning, Vol. 27 (4), July/August, 2005)“As the authors pointed out, the number of equations in the book is kept to a minimum, and important conceptions are also explained in a qualitative manner. A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.†(Microscopy and Microanalysis, Vol. 9 (5), October, 2003)
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Product details
Hardcover: 550 pages
Publisher: Springer; 4th ed. 2018 edition (November 18, 2017)
Language: English
ISBN-10: 149396674X
ISBN-13: 978-1493966745
Product Dimensions:
8.5 x 1.5 x 11.5 inches
Shipping Weight: 3.4 pounds (View shipping rates and policies)
Average Customer Review:
5.0 out of 5 stars
1 customer review
Amazon Best Sellers Rank:
#761,463 in Books (See Top 100 in Books)
It's a great book for SEM. Essential!
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